Scanning Electron Microscopy

A scanning electron microscope (SEM) uses a focused beam of electrons as the illumination source which is scanned or rastered over the surface of a sample to generate an image.  The shorter wavelength of electrons, relative to photons, allows for significantly higher resolution imaging and magnification of a specimen than is possible with light microscopy.  Electron microscopy also provides a much greater depth of field than light microscopes, allowing for the imaging of three-dimensional surfaces or objects.

At Stress Engineering Services, we feature the TESCAN VEGA IV Scanning Electron Microscope within our extensive suite of analytical equipment. Our SEM offers advanced “wide field” and “depth” imaging modes, significantly expanding the depth of field compared to traditional secondary electron imaging techniques. Enhancing our capabilities, our SEM can calibrate the stage position using a macro photograph of the sample, enabling seamless mapping of micrographs and spectra during imaging and analysis sessions.  It also excels in the collection and analysis of calibrated 3D images, providing accurate measurements of surface features’ height and depth, as well as surface roughness assessments. Additionally, our SEM’s extra-large sample chamber comfortably accommodates samples larger than a standard soda can, underscoring its versatility and suitability for a broad range of applications.